专利名称：DEVICE FOR MEASURING THE STATE OF
POLARIZATION OF AN INCIDENT WAVE OFFREQUENCY 10 GHZ TO 30 THZ
发明人：KNAP, WOJCIECH,TEPPE,
FRÉDÉRIC,DIAKONOVA, NINA,DIAKONOV,MICHEL,KLIMENKO, OLEG,GANICHEV,SERGEY,DREXLER, CHRISTOP
申请号：EP12794736.4申请日：20121204公开号：EP2791637B1公开日：20151021
摘要：The invention relates to a device (1) for measuring the state of polarization ofan incident wave of frequency 10 GHz to 30 THz, comprising a field effect transistor (2), areception antenna (3). According to the invention, the antenna parts (31, 33) detect acomponent of polarization of the wave, collinear with a direction (X) causing in thetransistor (2) an alternating detection voltage (Us), the parts (32, 33) detect a componentof polarization of the wave, collinear with a direction (Y) causing the appearance in thetransistor (2) of an alternating detection voltage (Ud), the transistor (2) being designed togenerate, as electrical detection signal (&Dgr;U) between the source terminal (21) andthe drain terminal (22), a DC detection voltage (&Dgr;U) a part of which is determined bythe state of elliptical polarization of the wave by interference in the transistor (2)between the alternating voltages (Us, Ud).
申请人：CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE (CNRS),CENTRE NAT
RECH SCIENT,CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE (CNRS)
地址：FR
国籍：FR
代理机构：Regimbeau
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