专利名称：Power supply apparatus for test apparatus发明人：Satoshi Kodera,Takahiko Shimizu申请号：US13219566申请日：20110826公开号：US08803501B2公开日：20140812
专利附图：
摘要：A voltage source generates a power supply voltage Vstabilized such that itmatches the voltage level that corresponds to a reference voltage V, and supplies thepower supply voltage to a DUT. A current detection circuit generates a detection voltageVm that corresponds to an output current Ithat flows through the DUT. In the initial
state, the reference voltage Vgenerated by a reference voltage generating circuit is setto an initial voltage level that corresponds to an input voltage V. After the output currentIflows, the reference voltage transits to a first voltage level Vobtained by shifting theinitial voltage level by a first voltage step that corresponds to the detection voltage Vm.Subsequently, the reference voltage Vtransits to a second voltage level VLobtained byshifting the initial voltage level by a second voltage step that corresponds to thedetection voltage Vm.
申请人：Satoshi Kodera,Takahiko Shimizu
地址：Tokyo JP,Tokyo JP
国籍：JP,JP
代理机构：Ladas & Parry, LLP
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