TEST PATTERN GENERATION APPARATUS, TEST PROGRAM GE

专利名称：TEST PATTERN GENERATION APPARATUS,

TEST PROGRAM GENERATION APPARATUS,GENERATION METHOD, PROGRAM, ANDTEST APPARATUS

发明人：Takuya TOYODA申请号：US13655468申请日：20121019

公开号：US20130290796A1公开日：20131031

专利附图：

摘要：A test pattern generating apparatus that generates a test pattern to be

communicated with a device under test having a plurality of terminals, the test patterngenerating apparatus comprising a primitive generating section that generates a cycleprimitive indicating a signal pattern to be communicated with each of the terminals duringa base cycle, based on instructions from a user; a device cycle generating section thatgenerates a device cycle indicating signal patterns of a plurality of base cycles, byarranging a plurality of the cycle primitives based on instructions from the user; and asequence generating section that generates a sequence of the test pattern to besupplied to the device under test, by arranging a plurality of the device cycles based oninstructions from the user.

申请人：ADVANTEST CORPORATION

地址：Tokyo JP

国籍：JP

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