专利名称：Coin testing apparatus
发明人：Johnson, Peter Reginald,Reyner, Peter
John,Hutchinson, Derek,Dean, Robert
申请号：EP84305100.4申请日：19840726公开号：EP0134686A2公开日：19850320
专利附图：
摘要：@ A coin testing apparatus subjects a coin inserted into a coin entry (1) androlling down an inclined track (2) to testing at a testing station (3) comprising sensors(4,5,6) which may for example be inductive sensors. If a coin is found to be acceptable an
accept signal is generated and this causes gate mechanism (8) to open to permit the cointo access accept path (9), the gate mechanism (8) being normally closed so thatunacceptable coins can only access a reject path (10). A post-gate detector (11) in theaccept path (9) senses the passage of an accepted coin and serves to close the gatemechanism (8) and also to determine allocation of a customer credit. A pre-gate detector(12) upstream of the gate mechanism (8) has its output logically processed with theaccept signal produced when an acceptable coin is tested and/or with the output of thepost-gate detector (11).
申请人：MARS INCORPORATED
地址：6885 Elm Street McLean Virginia 22101-3883 US
国籍：US
代理机构：Wright, Peter David John (GB)
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