Optical measuring arrangement, in particular for q

专利名称：Optical measuring arrangement, in particular

for quality control in continuous processes

发明人：Juergen Gobel,Werner Hoyme,Martin

Goetz,Wilhelm Schebesta

申请号：US09797154申请日：20010301

公开号：US20020001078A1公开日：20020103

专利附图：

摘要：An optical measuring arrangement, particularly for quality control in continuousmaterial flow processes, comprising a measuring head which is arranged immediately

adjacent to a measurement object, a measurement light source which is held at themeasuring head for illuminating a measurement spot on the measurement object, ameasurement light reception device, at least one spectrometer which is optically coupledwith the measurement light reception device via a light-conducting device, wherein thespectrometer and the light-conducting device are received in the measuring head, and asignal processing device which is likewise received in the measuring head. This results in acompact arrangement for reflection measurement which is easy to assemble and which,beyond this, supplies very accurate measurement results. Further, a measuringarrangement operating on the principle of spectroscopy is suggested for transmissionmeasurement. The disclosure further relates to a combined reflection and transmissionmeasurement device which carries out both measuring processes simultaneously.

申请人：GOBEL JUERGEN,HOYME WERNER,GOETZ MARTIN,SCHEBESTA WILHELM

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