专利名称：Multichip and method of testing the same发明人：Jin-Kook Jung申请号：US11985191申请日：20071114
公开号：US20080112242A1公开日：20080515
专利附图：
摘要：A multichip and method of testing a multichip, the multichip including a controlchip having a central processing unit (CPU) and a plurality of memories, each memory ofthe plurality of memories storing information related to testing the multichip, comprisesconnecting one of the memories to the control chip; reading, by the CPU, stored memory
information from the connected one of the memories to confirm the connected one ofthe memories; generating a test pattern relating to the connected one of the memoriesconfirmed by the CPU, and testing the connected one of the memories according to thetest pattern.
申请人：Jin-Kook Jung
地址：Gyeonggi-do KR
国籍：KR
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